U-OSM MICROMETER微分器

U-OSM MICROMETER微分器 

 

首頁 CNC TOMAS 2D3D 光電精測儀 光學顯微鏡 燈源總匯 CMI X-RAY 膜厚儀 ZEISS/TSK粗度儀 材料試驗機 公益看板


TOKYO SEIMITSU -TSK TOKYO SEIMITSU -TSK

 

OLYMPUS 系列 HOMA /LX 顯微鏡 PEAK  放大鏡 Motic 顯微鏡

向上 BXFM/BXFM-SX半套金相 U-OSM MICROMETER微分器 MX61/61L大金相 BX2M-CFU GX51/71倒立顯微鏡 MX-80(大金相r) SZX10/16實體顯微鏡 OLS-4000 LEXT 雷射顯微鏡 SZ61/SZ51實體顯微鏡 LIGHT 光源 OBJECTIVE 物鏡 工具顯微鏡(Tool micro.) 光學名詞註解

 
 
 
Eyepiece Magnification 10X, erect image (inverted when used with upright observation tube), F. N. 14. Diopter adjustment range: ±5 diopter. Provided with rubber eye shade.
Measuring scale Scale lines graduated in increments of 1mm in the entire 10mm length. Shift of scale lines: 1mm per rotation of the shift ring, the circumference of which is divided into 100 graduations.
Measuring range 10mm/objective magnification
Compensation limit for objective magnification tolerance ±5% by combined use of the zoom compensation ring and the provided stage micrometer. Compensation ring clamping screw. Magnification compensation scale.
Actual size Actual size(mm) = measured value(mm)/objective magnification
Reproducibility Reproducibility error ±0.007/A mm(A…objective magnification)
Accuracy Measuring error(A…objective magnification, L…measured length in mm)±[ (0.0002XA + 0.002)L + 0.007/A] mm



 
10/100 10mm in 100divisions
Cross 10/100 100 in 100 divisions on crosslines
H5/5 5mm in 5 divisions in grid pattern
H7/7 7mm in 7 divisions in grid pattern
H10/100 10mm in 100 divisions in grid pattern

鼎晶科技/Tomas ATG/TTG百輝/溫澤 BRILLANT 3D製造商(德國授權) (昆山 /東莞 立偉國際 )

電話:

0925-622-111   Google+

郵寄地址:

高雄市三民區水源路十六號五樓

客戶服務: cnc@hi-top.com.tw

Micr

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